The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measurement and allow reviving this technique for practical applications. We report on the use of the TimePix detector for such emission channeling experiments with samples containing 6Li, 7Be or 10B.