Publication
> 'Non-contact Electron optics System for Coincidence Imaging analysis'
Non-contact Electron optics System for Coincidence Imaging analysis
Author
Year
2010
Scientific journal
11th ICATPP Conference, Villa Olmo - Como (Italy), 5-9 October 2009, ISBN 10 981-4307-51-2, pp. 631 – 635
Web
Abstract
An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation
Cite article as:
M. Kroupa, J. Jakůbek, F. Krejčí, "Non-contact Electron optics System for Coincidence Imaging analysis", 11th ICATPP Conference, Villa Olmo - Como (Italy), 5-9 October 2009, ISBN 10 981-4307-51-2, pp. 631 – 635 (2010)