Publication
> 'Radiation hardness properties of full-3D active edge silicon sensors'
Radiation hardness properties of full-3D active edge silicon sensors
Author
Da Viá Cinzia
| Manchester University, Oxford Road, Manchester M13 9PL, UK
|
Hasi Jasmine
| Manchester University, Oxford Road, Manchester M13 9PL, UK
|
Kenney Chris
| Molecular Biology Consortium, Chicago, USA
|
Linhart Vladimir, Ing. Ph.D.
| IEAP
|
Parker Sherwood
| University of Hawaii, 874 Dillingham Blvd, Honolulu, HI 96817, USA
|
Slavíček Tomáš, Bc.
| IEAP
|
Watts Stephen
| Manchester University, Oxford Road, Manchester M13 9PL, UK
|
Bém Pavel
| Nuclear Physics Institute, Academy of Sciences of the Czech Republic, Rez near Prague, CZ-25068, Czech Republic
|
Horažďovský Tomáš, Ing.
| IEAP
|
Pospíšil Stanislav, Ing. DrSc.
| IEAP
|
Year
2008
Scientific journal
NIM A 587 (2008) 243–249
Web
Abstract
Full-three-dimensional (3D) pixel sensors, with electrodes penetrating through the entire silicon wafer, were fabricated at the Stanford Nanofabrication Facility, Stanford, California, USA. They have 71-μm-inter-electrode spacing, active edges and a compatible geometry to the ATLAS pixel detector readout electronics. Several samples were irradiated with neutrons to different doses up to an equivalent fluence of 8.6×1015 n1 MeVeq cm−2. This corresponds to the integrated fluence expected after 5 years at the Large Hadron Collider (LHC) with a luminosity of 1035 cm−2 s−1 at 4 cm from the interaction point, where the ATLAS B-Layer is placed. Before and after irradiation, signals were generated by a 1060 nm infrared laser calibrated to inject a charge of 14 fC. This corresponds to 3.5 minimum ionizing particles and should not perturb the charge status of the radiation-induced defects.
After 8.6×1015 n1 MeVeq cm−2 the signal collected was 38% and corresponded to 7200e− for a substrate thickness of 235 μm. Signal efficiency, radiation-induced leakage current and related damage parameters are discussed here and compared with simulations. Full-3D silicon detectors with active edges are being considered for forward proton tagging at the LHC, for the ATLAS pixel B-layer replacement and for the ATLAS pixel upgrade.
Projects
Cite article as:
C. Da Viá, J. Hasi, C. Kenney, V. Linhart, S. Parker, T. Slavíček, S. Watts, P. Bém, T. Horažďovský, S. Pospíšil, "Radiation hardness properties of full-3D active edge silicon sensors", NIM A 587 (2008) 243–249 (2008)