Stone consolidation is one of the major restoration treatments used for historical monuments preservation. A natural stone is a complicated heterogeneous porous system making the process of consolidation dependent on many variables. In practical restoration aims, for a given stone type, the selection of a suitable consolidant and consolidation conditions therefore remains a complex issue. The impregnation depth is a key factor for the assessment of the treatment efficiency. The combination of state-of-the-art hybrid pixel semiconductor detectors with newly available micro-focus X-ray sources makes possible to apply X-ray radiography, an ideal non-destructive tool, for penetration depth monitoring. In this study high-resolution X-ray radiography is used for monitoring the penetration depth of organosilicon consolidants in the Opuka stone. The penetration depth has been evaluated in relation to the time of consolidation, stone porosity and consolidation mixtures properties. The exact influence of the X-ray contrast agent on the consolidation depth has been investigated as well. The information obtained provides supplementary knowledge on the suitability of investigated products for the treatment of this type of stone. In our study, the capabilities of X-ray radiography have been demonstrated on X-ray radiography simple projections, high-resolution computed tomography (CT) as well as on the dynamic processes monitoring. The results thus can serve also as an instrumental and methodological example applicable for consolidation monitoring of other stone types.